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Image Search Results
Journal: Scientific Reports
Article Title: Stable, Free-space Optical Trapping and Manipulation of Sub-micron Particles in an Integrated Microfluidic Chip
doi: 10.1038/srep33842
Figure Lengend Snippet: 3D Finite element method (FEM) simulations of power flow and trapping force. Two counter-propagating beams are excited on each port and the each beam power of 1W is assumed. ( a ) A cross-section view of power flow, cut parallel to the waveguide. ( b ) Calculated magnitude of power flow along the x-axis at y = 0 and z = −375 nm position. Note that the position at x = 360 nm corresponds to the power equilibrium position in ( c,d ) Are vertical and transverse trapping forces, respectively, at x = 360 nm. ( e ) Shows calculated trapping stiffness along the y-axis in terms of different particle sizes. Solid dots are calculated by Maxwell stress tensor (MST) and solid gray line is a fitting curve by assuming Rayleigh particle (See ).
Article Snippet:
Techniques:
Journal: Scientific Reports
Article Title: Stable, Free-space Optical Trapping and Manipulation of Sub-micron Particles in an Integrated Microfluidic Chip
doi: 10.1038/srep33842
Figure Lengend Snippet: ( a , b ) Are 3D Finite element method (FEM) simulations. Note that a trapped particle 1 is located at x = 1.85 μm, y = 0, and z = −375 nm position; ( a ) | E | 2 distribution, cut parallel to the waveguide. A beam is excited on Port 2 and the beam power of 1 W is assumed. Scale bar, 1 μm. ( b ) Calculated power flow of the counter-propagating guided beams. Note that the power ratio of Port 1 to Port 2 is assumed by 2.3. ( c , d ) Are longitudinal and transverse positions of trapped particles, as obtained by analyzing the CCD images. ( e ) Time-lapsed images of the trapped particles in the array, showing that the array can be moved across the channel as a single unit. Scale bar, 2 μm.
Article Snippet:
Techniques: